Authors

Bennet, W.G.; Hooten, N.C.; Weeded-Wright, S.; Schrimpf, R.D.; Reed, R.A.; Alles, M.C.; Zhang, E.X.; Mc Curdy, M.W.; Linten, Dimitri; Jurczak, Gosia; Fantini, Andrea

Conference

23rd Conference on Application of Accelerators in Research and Industry - CAARI

Title

Efficient reliability testing of emerging memory technologies using multiple radiation sources

Publication type

Proceedings paper