TID and displacement damage resilience of 1T1R Hfo2 hf resistive memories

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Authors

Weeden-Wright, S.L.; Bennett, W.G.; Hooten, N.C.; Zhang, E.X.; McCurdy, M.W.; Schrimpf, R.D.; Reed, R.A.; Weller,; Fleetwood,; Alles, M.C.; Linten, Dimitri; Jurczak, Gosia; Fantini, Andrea

ISSN

0018-9499

Issue

6

Journal

IEEE Transactions on Nuclear Science

Volume

61

Title

TID and displacement damage resilience of 1T1R Hfo2 hf resistive memories

Publication type

Journal article

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