Publication:

TID and displacement damage resilience of 1T1R Hfo2 hf resistive memories

Date

2014
Journal article
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Author(s)

Weeden-Wright, S.L.
;
Bennett, W.G.
;
Hooten, N.C.
;
Zhang, E.X.
;
McCurdy, M.W.
;
Schrimpf, R.D.
;
Reed, R.A.
;
Weller,
;
Fleetwood,
;
Alles, M.C.
;
Linten, Dimitri  
;
Jurczak, Gosia  
;
Fantini, Andrea  

Journal

IEEE Transactions on Nuclear Science

Abstract

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