Browsing by author "Pichon, L."

Now showing items 1-1 of 1

Meyer-Neldel parameter as a figure of merit for quality of thin-film-transistor active layer?

Pichon, L.; Mercha, Abdelkarim; Routoure, J. M.; Carin, R.; Bonnaud, O.; Mohammed-Brahim, T. (2002)