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Meyer-Neldel parameter as a figure of merit for quality of thin-film-transistor active layer?
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Meyer-Neldel parameter as a figure of merit for quality of thin-film-transistor active layer?
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Date
2002
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pichon, L.
;
Mercha, Abdelkarim
;
Routoure, J. M.
;
Carin, R.
;
Bonnaud, O.
;
Mohammed-Brahim, T.
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1901
since deposited on 2021-10-14
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Acq. date: 2025-12-10
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Metrics
Views
1901
since deposited on 2021-10-14
2
last month
Acq. date: 2025-12-10
Citations