Authors

Pichon, L.; Mercha, Abdelkarim; Routoure, J. M.; Carin, R.; Bonnaud, O.; Mohammed-Brahim, T.

Conference

E-MRS Spring Meeting Symposium K: Thin Film Materials for Large-Area Electronics

Title

Meyer-Neldel parameter as a figure of merit for quality of thin-film-transistor active layer?

Publication type

Oral presentation