Browsing by author "Sawada, Masanori"
Now showing items 21-29 of 29
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SCCF - System to component level correlation factor
Thijs, Steven; Scholz, Mirko; Linten, Dimitri; Griffoni, Alessio; Russ, Christian; Stadler, Wolfgang; Lafonteese, David; Vashchenko, Vladislav; Sawada, Masanori; Concannon, Ann; Hopper, Peter; Jansen, Philippe; Groeseneken, Guido (2010) -
Self-protection capability of power arrays
Lafonteese, David; Vashchenko, Vladislav; Linten, Dimitri; Scholz, Mirko; Thijs, Steven; Sawada, Masanori; Nakaei, T; Hasebe, Takumi; Hopper, Peter; Groeseneken, Guido (2009-09) -
System to component level correlation factor
Thijs, Steven; Scholz, Mirko; Linten, Dimitri; Russ, Christian; Stadler, Wolfgang; Sawada, Masanori; Groeseneken, Guido (2010) -
System-level ESD protection design using on-wafer characterization and transient simulations
Scholz, Mirko; Chen, Shih-Hung; Thijs, Steven; Linten, Dimitri; Hellings, Geert; Vandersteen, Gerd; Sawada, Masanori; Groeseneken, Guido (2014) -
System-level ESD protection of high-voltage tolerant IC pins – A case study
Scholz, Mirko; Thijs, Steven; Griffoni, Alessio; Chen, Shih-Hung; Linten, Dimitri; Sawada, Masanori; Vandersteen, Gerd; Groeseneken, Guido (2011) -
System-level ESD protection of high-voltage tolerant IC pins – A case study with nLDMOS SCR
Scholz, Mirko; Thijs, Steven; Chen, Shih-Hung; Griffoni, Alessio; Linten, Dimitri; Sawada, Masanori; Vandersteen, Gerd; Groeseneken, Guido (2011) -
Transient characterization of high voltage switching devices
Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Sawada, Masanori; Vashchenko, V.; Vandersteen, Gerd; Groeseneken, Guido (2010) -
Voltage overshoot study in 20V DeMOS-SCR devices
Vashchenko, Vladislav; Jansen, Philippe; Scholz, Mirko; Hopper, Peter; Sawada, Masanori; Nakaei, Toshiyuki; Hasebe, Takumi; Thijs, Steven (2007-09) -
Wafer-Level LICCDM Device Testing
Simicic, Marko; Wu, Wei-Min; Claes, Dieter; Tamura, Shinichi; Shimada, Yohei; Sawada, Masanori; Chen, Shih-Hung (2021)