Voltage overshoot study in 20V DeMOS-SCR devices

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Authors
Vashchenko, Vladislav; Jansen, Philippe; Scholz, Mirko; Hopper, Peter; Sawada, Masanori; Nakaei, Toshiyuki; Hasebe, Takumi; Thijs, Steven
Conference
EOS/ESD Symposium Proceedings
Title
Voltage overshoot study in 20V DeMOS-SCR devices
Publication type
Proceedings paper
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