Browsing by author "Op de Beeck, Jonathan"
Now showing items 1-15 of 15
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3D imaging of atom probe tip shapes with atomic force microscopy
Fleischmann, Claudia; Paredis, Kristof; Melkonyan, Davit; Op de Beeck, Jonathan; Bogdanowicz, Janusz; Morris, Richard; Cuduvally, Ramya; Vandervorst, Wilfried (2018) -
APT tip shape imaging by SPM
Op de Beeck, Jonathan; Fleischmann, Claudia; Paredis, Kristof; van der Heide, Paul; Vandervorst, Wilfried (2019) -
Combined in-situ scanning force microscopy/TOFSIMS and FIB-TOFSIMS analysis: towards 3D chemical analysis
Conard, Thierry; Franquet, Alexis; Spampinato, Valentina; Op de Beeck, Jonathan; Celano, Umberto; Vandervorst, Wilfried; Moeler, Rudolf; Labyedh, Nouha; Vereecken, Philippe (2017) -
Direct imaging and manipulation of ionic diffusion in mixed electronic-ionic conductors
Op de Beeck, Jonathan; Labyedh, Nouha; Sepulveda Marquez, Alfonso; Spampinato, Valentina; Franquet, Alexis; Conard, Thierry; Vereecken, Philippe; Celano, Umberto (2018) -
Direct probing of the dielectric scavenging-layer interface in oxide filamentary-based valence change memory
Celano, Umberto; Op de Beeck, Jonathan; Clima, Sergiu; Luebben, Michael; Koenraad, Paul; Goux, Ludovic; Valov, Ilia; Vandervorst, Wilfried (2017) -
Improved atom probe reconstruction through tp shape constraints supplied by scanning probe microscopy
Op de Beeck, Jonathan; Fleischmann, Claudia; Paredis, Kristof; van der Heide, Paul; Vandervorst, Wilfried; Geiser, Brian; Bunton, Joe; Ulfig, Robert; Larson, Dave (2020) -
Improving APT-AFM technology: towards high resolution 3D APT tip shapes
Op de Beeck, Jonathan; Fleischmann, Claudia; Paredis, Kristof; Vandervorst, Wilfried (2018) -
Nanoscale electrochemical response of lithium-ion cathodes: a combinatorial study using C-AFM and SIMS
Op de Beeck, Jonathan; Labyedh, Nouha; Sepulveda Marquez, Alfonso; Spampinato, Valentina; Franquet, Alexis; Conard, Thierry; Vereecken, Philippe; Vandervorst, Wilfried; Celano, Umberto (2018) -
Nanoscale localisation of an atom probe tip through electric field mapping
Op de Beeck, Jonathan; Fleischmann, Claudia; Vandervorst, Wilfried; Paredis, Kristof (2020) -
Opportunities and challenges in APT metrology for semiconductor applications
Fleischmann, Claudia; Cuduvally, Ramya; Morris, Richard; Melkonyan, Davit; Op de Beeck, Jonathan; Makhotkin, Igor; van der Heide, Paul; Vandervorst, Wilfried (2019) -
Scanning probe microscopy for atom probe tip shape monitoring
Op de Beeck, Jonathan; Fleischmann, Claudia; Paredis, Kristof; Vandervorst, Wilfried (2020) -
The need of a reference for APT-AFM tip reconstruction
Op de Beeck, Jonathan; Fleischmann, Claudia; Paredis, Kristof; Vandervorst, Wilfried (2018) -
The Prospect of Spatially Accurate Reconstructed Atom Probe Data Using Experimental Emitter Shapes
Op de Beeck, Jonathan; Scheerder, Jeroen; Geiser, Brian P.; Bunton, Joseph H.; Ulfig, Robert M.; Larson, David J.; van der Heide, Paul; Vandervorst, Wilfried; Fleischmann, Claudia (2022) -
The synergy of AFM and SIMS for advanced characterization of Li-ion battery cathodes
Op de Beeck, Jonathan; Celano, Umberto; Labyedh, Nouha; Sepulveda Marquez, Alfonso; Spampinato, Valentina; Franquet, Alexis; Vereecken, Philippe; Koenraad, Paul; Vandervorst, Wilfried (2017) -
Tip-to-tip approach for APT shape imaging
Op de Beeck, Jonathan; Fleischmann, Claudia; Paredis, Kristof; Vandervorst, Wilfried (2019)