Browsing by author "Fleetwood,"
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TID and displacement damage resilience of 1T1R Hfo2 hf resistive memories
Weeden-Wright, S.L.; Bennett, W.G.; Hooten, N.C.; Zhang, E.X.; McCurdy, M.W.; Schrimpf, R.D.; Reed, R.A.; Weller,; Fleetwood,; Alles, M.C.; Linten, Dimitri; Jurczak, Gosia; Fantini, Andrea (2014) -
Total-ionizing-dose effects and low-frequency noise in 16-nm InGaAs FinFETs with HfO2/Al2O3 dielectrics
Bonaldo,; Zhao,; O Hara,; Gorchichko,; Zhang,; Gerardin,; Paccagnella,; Waldron, Niamh; Collaert, Nadine; Putcha, Vamsi; Linten, Dimitri; Pantelides,; Reed,; Schrimpf,; Fleetwood, (2020)