Publication:
Total-ionizing-dose effects and low-frequency noise in 16-nm InGaAs FinFETs with HfO2/Al2O3 dielectrics
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2000 since deposited on 2021-10-28
Acq. date: 2025-10-27
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2000 since deposited on 2021-10-28
Acq. date: 2025-10-27
Citations