Browsing by author "Rinaudo, Pietro"
Now showing items 1-3 of 3
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Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI
Rinaudo, Pietro; Vaisman Chasin, Adrian; Franco, Jacopo; Wu, Zhicheng; Subhechha, Subhali; Arutchelvan, Goutham; Eneman, Geert; Yengula Venkata Ramana, Bhuvaneshwari; Rassoul, Nouredine; Delhougne, Romain; Kaczer, Ben; De Wolf, Ingrid; Kar, Gouri Sankar (2023) -
Fundamental understanding of NBTI degradation mechanism in IGZO channel devices
Zhao, Ying; Rinaudo, Pietro; Vaisman Chasin, Adrian; Truijen, Brecht; Kaczer, Ben; Rassoul, Nouredine; Dekkers, Harold; Belmonte, Attilio; De Wolf, Ingrid; Kar, Gouri Sankar; Franco, Jacopo (2024) -
Light-assisted investigation of the role of oxygen flow during IGZO deposition on deep subgap states and their evolution under PBTI
Rinaudo, Pietro; Vaisman Chasin, Adrian; Zhao, Ying; Kaczer, Ben; Rassoul, Nouredine; Dekkers, Harold; van Setten, Michiel; Belmonte, Attilio; De Wolf, Ingrid; Kar, Gouri Sankar; Franco, Jacopo (2024)