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Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI
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Authors
Rinaudo, Pietro
;
Vaisman Chasin, Adrian
;
Franco, Jacopo
;
Wu, Zhicheng
;
Subhechha, Subhali
;
Arutchelvan, Goutham
;
Eneman, Geert
;
Yengula Venkata Ramana, Bhuvaneshwari
;
Rassoul, Nouredine
;
Delhougne, Romain
;
Kaczer, Ben
;
De Wolf, Ingrid
;
Kar, Gouri Sankar
DOI
10.1109/TDMR.2023.3282298
ISSN
1530-4388
Issue
3
Journal
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Volume
23
Title
Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI
Publication type
Journal article
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2
20.500.12860/42701.2
*
2023-11-21T08:55:22Z
validation by library/open access desk
1
20.500.12860/42701
2023-10-11T18:51:57Z
*Selected version
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