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Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI

dc.contributor.authorRinaudo, Pietro
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorFranco, Jacopo
dc.contributor.authorWu, Zhicheng
dc.contributor.authorSubhechha, Subhali
dc.contributor.authorArutchelvan, Goutham
dc.contributor.authorEneman, Geert
dc.contributor.authorYengula Venkata Ramana, Bhuvaneshwari
dc.contributor.authorRassoul, Nouredine
dc.contributor.authorDelhougne, Romain
dc.contributor.authorKaczer, Ben
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorKar, Gouri Sankar
dc.date.accessioned2023-11-21T09:02:11Z
dc.date.available2023-10-11T18:51:57Z
dc.date.available2023-11-21T09:02:11Z
dc.date.issued2023
dc.identifier.issn1530-4388
dc.identifier.otherWOS:001063339300005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42701.2
dc.sourceWOS
dc.titleDegradation Mapping and Impact of Device Dimension on IGZO TFTs BTI
dc.typeJournal article
dc.contributor.imecauthorRinaudo, Pietro
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorWu, Zhicheng
dc.contributor.imecauthorSubhechha, Subhali
dc.contributor.imecauthorArutchelvan, Goutham
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorYengula Venkata Ramana, Bhuvaneshwari
dc.contributor.imecauthorRassoul, Nouredine
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecSubhechha, Subhali::0000-0002-1960-5136
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecRassoul, Nouredine::0000-0001-9489-3396
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.identifier.doi10.1109/TDMR.2023.3282298
dc.source.numberofpages9
dc.source.peerreviewyes
dc.source.beginpage337
dc.source.endpage345
dc.source.journalIEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
dc.source.issue3
dc.source.volume23
imec.availabilityPublished - imec


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220.500.12860/42701.2*2023-11-21T08:55:22Zvalidation by library/open access desk
120.500.12860/427012023-10-11T18:51:57Z

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