Browsing by author "Nakaei, Toshiyuki"

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On-wafer human metal model – system-level ESD stress on component level

Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Sawada, Masanori; Nakaei, Toshiyuki; Hasebe, Takumi; Groeseneken, Guido (2008-10)
Voltage overshoot study in 20V DeMOS-SCR devices

Vashchenko, Vladislav; Jansen, Philippe; Scholz, Mirko; Hopper, Peter; Sawada, Masanori; Nakaei, Toshiyuki; Hasebe, Takumi; Thijs, Steven (2007-09)