Browsing by author "Hull, R."
Now showing items 1-4 of 4
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Characterization of strain in an advanced semiconductor laser structure with nanometer range resolution using a new algorithm for electron diffraction contrast imaging interpretation
Janssens, Koenraad; Van Der Biest, O.; Vanhellemont, Jan; Maes, Herman; Hull, R. (1995) -
Electron diffraction contrast imaging as a tool for nano-range strain analysis and application to a semiconductor laser structure
Janssens, Koenraad; Vanhellemont, Jan; Maes, Herman; Van Der Biest, O.; Hull, R. (1995) -
Localised strain characterisation in semiconductor structures using electron diffraction contrast imaging
Janssens, Koenraad; Van Der Biest, O.; Vanhellemont, Jan; Maes, Herman; Hull, R.; Bean, J. C. (1995) -
Strain Analysis with Nanometer Resolution using a Conventional Transmission Electron Microscope Technique: Electron Diffraction Contrast Imaging Revisited
Janssens, Koenraad; Van Der Biest, O.; Vanhellemont, Jan; Maes, Herman; Hull, R. (1995)