Authors

Janssens, Koenraad; Vanhellemont, Jan; Maes, Herman; Van Der Biest, O.; Hull, R.

Conference

Microscopy of Semiconducting Materials 1995. Proceedings

Title

Electron diffraction contrast imaging as a tool for nano-range strain analysis and application to a semiconductor laser structure

Publication type

Proceedings paper

Embargo date

9999-12-31