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Electron diffraction contrast imaging as a tool for nano-range strain analysis and application to a semiconductor laser structure
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Electron diffraction contrast imaging as a tool for nano-range strain analysis and application to a semiconductor laser structure
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Date
1995
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Janssens, Koenraad
;
Vanhellemont, Jan
;
Maes, Herman
;
Van Der Biest, O.
;
Hull, R.
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1947
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Acq. date: 2025-12-14
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Views
1947
since deposited on 2021-09-29
1
last month
1
last week
Acq. date: 2025-12-14
Citations