Electron diffraction contrast imaging as a tool for nano-range strain analysis and application to a semiconductor laser structure

Publication:

1995

Proceedings Paper

Author(s)

Janssens, Koenraad

;

Vanhellemont, Jan

;

Maes, Herman

;

Van Der Biest, O.

;

Hull, R.

1952 since deposited on 2021-09-29

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Acq. date: 2026-02-27