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Conference contributions
Electron diffraction contrast imaging as a tool for nano-range strain analysis and application to a semiconductor laser structure
Publication:
Electron diffraction contrast imaging as a tool for nano-range strain analysis and application to a semiconductor laser structure
Date
1995
Proceedings Paper
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667.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Janssens, Koenraad
;
Vanhellemont, Jan
;
Maes, Herman
;
Van Der Biest, O.
;
Hull, R.
Journal
Abstract
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1943
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1943
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations