Browsing by author "Palenskis, V."

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High frequency RTS noise in submicron MOSFETs

Sikula, J.; Hruska, P.; Vasina, Petr; Claeys, Cor; Simoen, Eddy; Matulionis, A.; Stadalnikas, A.; Palenskis, V. (1996)
Noise and THI reliability indicators for thin film resistors

Sikula, J.; Hruska, P.; Vasina, Petr; Schauer, P.; Kolarova, R.; Hajek, K.; Stadalnikas, A.; Palenskis, V.; Claeys, Cor; Simoen, Eddy (1996)