Browsing by author "Ching, L. Y."
Now showing items 1-3 of 3
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Influence of device geometry on ESD performance for deep submicron CMOS technology
Bock, Karlheinz; Keppens, Bart; De Heyn, Vincent; Groeseneken, Guido; Ching, L. Y.; Naem, Abdalla (1999) -
Influence of gate length on ESD performance for deep submicron CMOS technology
Bock, Karlheinz; Keppens, Bart; De Heyn, Vincent; Groeseneken, Guido; Ching, L. Y.; Naem, Abdalla (1999) -
Influence of gate length on ESD-performance for deep submicron CMOS technology
Bock, Karlheinz; Keppens, Bart; De Heyn, Vincent; Groeseneken, Guido; Ching, L. Y.; Naem, Abdalla (2001)