Influence of gate length on ESD performance for deep submicron CMOS technology

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Authors
Bock, Karlheinz; Keppens, Bart; De Heyn, Vincent; Groeseneken, Guido; Ching, L. Y.; Naem, Abdalla
Conference
Electrical Overstress/Electrostatic Discharge Symposium Proceedings - EOS-ESD
Title
Influence of gate length on ESD performance for deep submicron CMOS technology
Publication type
Proceedings paper
Embargo date
9999-12-31
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