Publication:

Influence of gate length on ESD performance for deep submicron CMOS technology

Date

1999

Proceedings Paper

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Files

3201.pdf 1.13 MB

Author(s)

Bock, Karlheinz

;

;

De Heyn, Vincent

;

Groeseneken, Guido

;

;

Statistics

1935 since deposited on 2021-10-06

Acq. date: 2026-01-26