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    • IoT: Source of test challenges 

      Marinissen, Erik Jan; Zorian, Yervant; Konijnenburg, Mario; Huang, Chih-Tsun; Hsieh, Ping-Hsuan; Cockburn, Peter; Delvaux, Jeroen; Rozic, Vladimir; Yang, Bohan; Singelee, Dave; Verbauwhede, Ingrid; Mayor, Cedric; van Rijsinge, Robert; Reyes, Cocoy (2016-05)