Publication:

IoT: Source of test challenges

Date

2016-05

Proceedings Paper

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Author(s)

Marinissen, Erik Jan

;

Zorian, Yervant

;

Konijnenburg, Mario

;

Huang, Chih-Tsun

;

Hsieh, Ping-Hsuan

;

Cockburn, Peter

;

Delvaux, Jeroen

;

Rozic, Vladimir

;

;

;

Verbauwhede, Ingrid

;

;

van Rijsinge, Robert

;

Metrics

1956 since deposited on 2021-10-23

Acq. date: 2025-12-10