Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
IoT: Source of test challenges
Publication:
IoT: Source of test challenges
Date
2016-05
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marinissen, Erik Jan
;
Zorian, Yervant
;
Konijnenburg, Mario
;
Huang, Chih-Tsun
;
Hsieh, Ping-Hsuan
;
Cockburn, Peter
;
Delvaux, Jeroen
;
Rozic, Vladimir
;
Yang, Bohan
;
Singelee, Dave
;
Verbauwhede, Ingrid
;
Mayor, Cedric
;
van Rijsinge, Robert
;
Reyes, Cocoy
Journal
Abstract
Description
Metrics
Views
1953
since deposited on 2021-10-23
419
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1953
since deposited on 2021-10-23
419
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations