Browsing by author "Yuan, Xiao Jie"
Now showing items 1-3 of 3
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Analysis of plasma induced gate oxide damage in multi-level metal processing
Yuan, Xiao Jie; Van den Bosch, Geert; Lietaer, Nicolas; Zagrebnov, Maxim; Debusschere, Ingrid; Deferm, Ludo (1998) -
Innovating SRAM design and test program for fast process related defect recognition and failure analysis
Coppens, P.; Vanhorebeek, Guido; De Backer, E.; Yuan, Xiao Jie (1999) -
Innovating SRAM design for fast process related defect recognition and failure analysis
Coppens, P.; Vanhorebeek, Guido; De Backer, E.; Yuan, Xiao Jie (1999)