Browsing by author "Lin, L."
Now showing items 1-4 of 4
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A single pulse charge pumping technique for fast measurements of interface states
Lin, L.; Ji, Zhigang; Zhang, Jian Fu; Zhang, Wei Dong; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido (2011) -
A test-proven As-grown-Generation (A-G) model for predicting NBTI under use-bias
Ji, Z.; Zhang, J.F.; Lin, L.; Duan, M.; Zhang, W.; Zhang, X.; Gao, R.; Kaczer, Ben; Franco, Jacopo; Schram, Tom; Horiguchi, Naoto; De Gendt, Stefan; Groeseneken, Guido (2015) -
Dominant layer for stress-induced positive charges in Hf-based gate stacks
Zhang, Jian F.; Chang, M.H.; Ji, Z.; Lin, L.; Ferain, Isabelle; Groeseneken, Guido; Pantisano, Luigi; De Gendt, Stefan; Heyns, Marc (2008) -
NBTI lifetime prediction and kinetics at operation bias based on ultrafast pulse measurement
Ji, Zhigang; Lin, L.; Zhang, Jian Fu; Kaczer, Ben; Groeseneken, Guido (2010)