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A test-proven As-grown-Generation (A-G) model for predicting NBTI under use-bias
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A test-proven As-grown-Generation (A-G) model for predicting NBTI under use-bias
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Date
2015
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ji, Z.
;
Zhang, J.F.
;
Lin, L.
;
Duan, M.
;
Zhang, W.
;
Zhang, X.
;
Gao, R.
;
Kaczer, Ben
;
Franco, Jacopo
;
Schram, Tom
;
Horiguchi, Naoto
;
De Gendt, Stefan
;
Groeseneken, Guido
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Views
1888
since deposited on 2021-10-22
1
last month
1
last week
Acq. date: 2026-01-08
Citations