Browsing by author "Jolley, Mike"

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Evaluation of TSV and micro-bump probing for wide I/O testing

Smith, Ken; Hanaway, Peter; Jolley, Mike; Gleason, Reed; Strid, Eric; Daenen, Tom; Dupas, Luc; Knuts, Bruno; Marinissen, Erik Jan; Van Dievel, Marc (2011-09)
Test strategies for wide-I/O memory, 3D-TSV technology test vehicles and ultra-fine-pitch applications

Smith, Ken; Bock, Daniel; Gleeson, Read; Jolley, Mike; Marinissen, Erik Jan (2012-11)