Browsing by author "Egger, P."
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Analysis of HBM ESD testers and specifications using a fourth order lumped element model
Verhaege, Koen; Roussel, Philippe; Groeseneken, Guido; Maes, Herman; Gieser, H.; Russ, Christian; Egger, P.; Guggenmos, X.; Kuper, F. G. (1994) -
Influence of tester, test method and device type on CDM ESD testing
Verhaege, Koen; Groeseneken, Guido; Maes, Herman; Egger, P.; Gieser, H. (1994) -
Influence of tester, test method and device type on CDM ESD testing
Verhaege, K.; Groeseneken, Guido; Maes, Herman; Egger, P.; Gieser, H. (1995)