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Analysis of HBM ESD testers and specifications using a fourth order lumped element model
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Authors
Verhaege, Koen
;
Roussel, Philippe
;
Groeseneken, Guido
;
Maes, Herman
;
Gieser, H.
;
Russ, Christian
;
Egger, P.
;
Guggenmos, X.
;
Kuper, F. G.
Journal
Quality and Reliability Engineering International
Volume
10
Title
Analysis of HBM ESD testers and specifications using a fourth order lumped element model
Publication type
Journal article
Embargo date
9999-12-31
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