Analysis of HBM ESD testers and specifications using a fourth order lumped element model

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Authors
Verhaege, Koen; Roussel, Philippe; Groeseneken, Guido; Maes, Herman; Gieser, H.; Russ, Christian; Egger, P.; Guggenmos, X.; Kuper, F. G.
Journal
Quality and Reliability Engineering International
Volume
10
Title
Analysis of HBM ESD testers and specifications using a fourth order lumped element model
Publication type
Journal article
Embargo date
9999-12-31
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