Publication:
Analysis of HBM ESD testers and specifications using a fourth order lumped element model
Date
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0003-3763-2098 | |
| cris.virtual.orcid | 0000-0002-0402-8225 | |
| cris.virtualsource.department | 2fcc3f32-b96b-4ece-a34c-e0dd87c237c9 | |
| cris.virtualsource.department | f2e648b4-91e6-42de-bb5d-66326414095e | |
| cris.virtualsource.orcid | 2fcc3f32-b96b-4ece-a34c-e0dd87c237c9 | |
| cris.virtualsource.orcid | f2e648b4-91e6-42de-bb5d-66326414095e | |
| dc.contributor.author | Verhaege, Koen | |
| dc.contributor.author | Roussel, Philippe | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.author | Maes, Herman | |
| dc.contributor.author | Gieser, H. | |
| dc.contributor.author | Russ, Christian | |
| dc.contributor.author | Egger, P. | |
| dc.contributor.author | Guggenmos, X. | |
| dc.contributor.author | Kuper, F. G. | |
| dc.contributor.imecauthor | Roussel, Philippe | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.date.accessioned | 2021-09-29T12:51:57Z | |
| dc.date.available | 2021-09-29T12:51:57Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 1994 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/437 | |
| dc.source.beginpage | 325 | |
| dc.source.endpage | 334 | |
| dc.source.journal | Quality and Reliability Engineering International | |
| dc.source.volume | 10 | |
| dc.title | Analysis of HBM ESD testers and specifications using a fourth order lumped element model | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |