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Analysis of HBM ESD testers and specifications using a fourth order lumped element model
Publication:
Analysis of HBM ESD testers and specifications using a fourth order lumped element model
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Date
1994
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Verhaege, Koen
;
Roussel, Philippe
;
Groeseneken, Guido
;
Maes, Herman
;
Gieser, H.
;
Russ, Christian
;
Egger, P.
;
Guggenmos, X.
;
Kuper, F. G.
Journal
Quality and Reliability Engineering International
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Acq. date: 2025-12-12
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Metrics
Views
2123
since deposited on 2021-09-29
2
last month
1
last week
Acq. date: 2025-12-12
Citations