Browsing by author "Lin, H.C."
Now showing items 1-3 of 3
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Capacitance-voltage (CV) characterization of GaAs/high-k oxide interfaces
Brammertz, Guy; Lin, H.C.; Martens, Koen; Merckling, Clement; Penaud, J.; Alian, AliReza; Sioncke, Sonja; Wang, Wei-E; Meuris, Marc; Caymax, Matty; Heyns, Marc (2008) -
Capacitance-voltage (CV)characterization of GaAs-oxide interfaces
Brammertz, Guy; Lin, H.C.; Martens, Koen; Mercier, David; Merckling, Clement; Penaud, Julien; Adelmann, Christoph; Sioncke, Sonja; Wang, Wei-E; Caymax, Matty; Meuris, Marc; Heyns, Marc (2008) -
Electrical properties of III-V/oxide interfaces
Brammertz, Guy; Lin, H.C.; Martens, Koen; Alian, AliReza; Merckling, Clement; Penaud, Julien; Kohen, David; Wang, Wei-E; Sioncke, Sonja; Delabie, Annelies; Meuris, Marc; Caymax, Matty; Heyns, Marc (2009)