Publication:

Capacitance-voltage (CV) characterization of GaAs/high-k oxide interfaces

Date

2008
Meeting abstract
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Author(s)

Brammertz, Guy  
;
Lin, H.C.
;
Martens, Koen  
;
Merckling, Clement  
;
Penaud, J.
;
Alian, AliReza  
;
Sioncke, Sonja
;
Wang, Wei-E
;
Meuris, Marc  
;
Caymax, Matty  
;
Heyns, Marc  

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