Publication:

Capacitance-voltage (CV) characterization of GaAs/high-k oxide interfaces

Date

2008
Meeting abstract
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

17378.pdf 247.72 KB

Author(s)

Brammertz, Guy  
;
Lin, H.C.
;
Martens, Koen  
;
Merckling, Clement  
;
Penaud, J.
;
Alian, AliReza  
;
Sioncke, Sonja
;
Wang, Wei-E
;
Meuris, Marc  
;
Caymax, Matty  
;
Heyns, Marc  

Journal

Abstract

Description

Statistics

Views

2006 since deposited on 2021-10-17
1last month
Acq. date: 2026-04-07

Citations

Statistics

Views

2006 since deposited on 2021-10-17
1last month
Acq. date: 2026-04-07

Citations