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Capacitance-voltage (CV) characterization of GaAs/high-k oxide interfaces

Date

2008
Meeting abstract
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dc.contributor.authorBrammertz, Guy
dc.contributor.authorLin, H.C.
dc.contributor.authorMartens, Koen
dc.contributor.authorMerckling, Clement
dc.contributor.authorPenaud, J.
dc.contributor.authorAlian, AliReza
dc.contributor.authorSioncke, Sonja
dc.contributor.authorWang, Wei-E
dc.contributor.authorMeuris, Marc
dc.contributor.authorCaymax, Matty
dc.contributor.authorHeyns, Marc
dc.contributor.imecauthorBrammertz, Guy
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecBrammertz, Guy::0000-0003-1404-7339
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.contributor.orcidimecAlian, AliReza::0000-0003-3463-416X
dc.date.accessioned2021-10-17T06:23:09Z
dc.date.available2021-10-17T06:23:09Z
dc.date.embargo9999-12-31
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13446
dc.source.beginpage1973
dc.source.conference214th ECS Meeting
dc.source.conferencedate12/10/2008
dc.source.conferencelocationHonolulu, HI 2008
dc.title

Capacitance-voltage (CV) characterization of GaAs/high-k oxide interfaces

dc.typeMeeting abstract
dspace.entity.typePublication
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