Browsing by author "Havelund, R."

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Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors

Fleischmann, Claudia; Conard, Thierry; Havelund, R.; Franquet, Alexis; Poleunis, C.; Voroshazi, Eszter; Delcorte, A.; Vandervorst, Wilfried (2013)
Inorganic material profiling using Arn + cluster: Can we achieve high Quality profiles?

Conard, Thierry; Fleischmann, Claudia; Havelund, R.; Franquet, Alexis; Poleunis, Claude; Delcorte, Aranaud; Vandervorst, Wilfried (2013)