Browsing by author "Amoroso, Salvatore"
Now showing items 1-3 of 3
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Interplay between statistical variability and reliability in contemporary p-MOSFETs: measurements vs. simulated
Hussin, Razaidi; Amoroso, Salvatore; Gerrer, Louis; Kaczer, Ben; Weckx, Pieter; Franco, Jacopo; Vanderheyden, Annelies; Vanhaeren, Danielle; Horiguchi, Naoto; Asenov, Asen (2014) -
Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow
Hussin, Razaidi; Gerrer, Louis; Ding, Jie; Wang, Liping; Amoroso, Salvatore; Cheng, Binjie; Weckx, Pieter; Simicic, Marko; Franco, Jacopo; Vanderheyden, Annelies; Vanhaeren, Danielle; Horiguchi, Naoto; Kaczer, Ben; Asenov, Asen (2015) -
TCAD-based methodology for reliability assessment of nanoscaled MOSFETs
Hussin, Razaidi; Gerrer, Louis; Amoroso, Salvatore; Wang, Liping; Weckx, Pieter; Franco, Jacopo; Vanderheyden, Annelies; Vanhaeren, Danielle; Horiguchi, Naoto; Kaczer, Ben; Asenov, Asen (2015)