Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow

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Authors
Hussin, Razaidi; Gerrer, Louis; Ding, Jie; Wang, Liping; Amoroso, Salvatore; Cheng, Binjie; Weckx, Pieter; Simicic, Marko; Franco, Jacopo; Vanderheyden, Annelies; Vanhaeren, Danielle; Horiguchi, Naoto; Kaczer, Ben; Asenov, Asen
Conference
45th European Solid State Device Research Conference - ESSDERC
Title
Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow
Publication type
Proceedings paper
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