Browsing by author "Dehaerne, Enrique"
Now showing items 1-5 of 5
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A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection
Dehaerne, Enrique; Dey, Bappaditya; Halder, Sandip (2022) -
Code Generation Using Machine Learning: A Systematic Review
Dehaerne, Enrique; Dey, Bappaditya; Halder, Sandip; De Gendt, Stefan; Meert, Wannes (2022) -
Optimizing YOLOv7 for Semiconductor Defect Detection
Dehaerne, Enrique; Dey, Bappaditya; Halder, Sandip; De Gendt, Stefan (2023) -
SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering
Hwang, MinJin; Dey, Bappaditya; Dehaerne, Enrique; Halder, Sandip; Shin, Young-Han (2023) -
Towards Improving Challenging Stochastic Defect Detection in SEM Images Based on Improved YOLOv5
Dey, Bappaditya; Dehaerne, Enrique; Halder, Sandip (2022)