Browsing by author "van Zijl, Jeroen"
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Materials and electrical characterization of metal gate electrodes on high-k dielectrics for advanced CMOS technologies
Hooker, Jacob; Lander, Rob; Rittersma, Chris; Schram, Tom; Lujan, Guilherme; van Zijl, Jeroen; van den Heuvel, Eric; Roozeboom, Fred (2002) -
Shallow junctions for sub-100 nm CMOS technology
Meyssen, Veerle; Stolk, Peter; van Zijl, Jeroen; van Berkum, Jurgen; van de Wijgert, Willem; Lindsay, Richard; Dachs, Charles; Mannino, Giovanni; Cowern, Nick (2001)