Browsing by author "Ikeda, Hiroaki"

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CDM ESD testing of a 3D TSV stacked IC chip

Nagata, Nagata; Takaya, Satoshi; Ikeda, Hiroaki; Linten, Dimitri; Scholz, Mirko; Chen, Shih-Hung; Hasegawa, Keiichi; Shintani, Taizo; Sawada, Masanori (2014-10)
CDM protection of a 3D TSV memory IC with a 100 GB/s Wide I/O data bus

Nagata, Makoto; Takaya, Satoshi; Ikeda, Hiroaki; Linten, Dimitri; Scholz, Mirko; Chen, Shih-Hung; Hasegawa, Keiichi; Shintani, Taizo; Sawada, Masanori (2014-09)