Browsing by author "Truong, Vinh-Binh"
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Soft X-ray reflectometry for the inspection of interlayer roughness in stacked thin film structures
Ciesielski, Richard; Loo, Roger; Shimura, Yosuke; Bogdanowicz, Janusz; Mani, Antonio; Mitterbauer, Christoph; Truong, Vinh-Binh; Kolbe, Michael; Soltwisch, Victor (2024)