Browsing by author "Hieckmann, E."
Now showing items 1-3 of 3
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A deep level transient spectroscopy study on the interface states across grain boundaries in multicrystalline silicon
Chen, J.; Cornagliotti, Emanuele; Simoen, Eddy; Hieckmann, E.; Weber, J.; Poortmans, Jef (2011) -
Electrical properties along grain boundaries in multicrystalline silicon measured by capacitance technique
Chen, Jimmy; Simoen, Eddy; Cornagliotti, Emanuele; Hieckmann, E.; Weber, J.; Poortmans, Jef (2011) -
On the electrical characterization of grain boundaries in multicrytalline silicon
Chen, Jiahe; Cornagliotti, Emanuele; Hieckmann, E.; Berendt, S.; Weber, J.; Simoen, Eddy; Poortmans, Jef (2011)