Authors

Chen, J.; Cornagliotti, Emanuele; Simoen, Eddy; Hieckmann, E.; Weber, J.; Poortmans, Jef

ISSN

1862-6254

Issue

8

Journal

Physica Status Solidi. Rapid Research Letters

Volume

5

Title

A deep level transient spectroscopy study on the interface states across grain boundaries in multicrystalline silicon

Publication type

Journal article

Embargo date

9999-12-31