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A deep level transient spectroscopy study on the interface states across grain boundaries in multicrystalline silicon
Publication:
A deep level transient spectroscopy study on the interface states across grain boundaries in multicrystalline silicon
Date
2011
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chen, J.
;
Cornagliotti, Emanuele
;
Simoen, Eddy
;
Hieckmann, E.
;
Weber, J.
;
Poortmans, Jef
Journal
Physica Status Solidi. Rapid Research Letters
Abstract
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2013
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Views
2013
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations