Now showing items 1-2 of 2

    • HBM ESD robustness of GaN-on-Si Schottky diodes 

      Chen, Shih-Hung; Griffoni, Alessio; Srivastava, Puneet; Linten, Dimitri; Thijs, Steven; Scholz, Mirko; Marcon, Denis; Gallerano, A.; Lafonteese, D.; Concannon, A.; Vashchenko, V.A.; Hopper, P.; Bychikhin, S.; Pogany, D.; Van Hove, Marleen; Decoutere, Stefaan; Groeseneken, Guido (2012)
    • On-wafer human metal model measurements for system-level ESD analysis 

      Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Sawada, Masanori; Nakaei, T.; Hasebe, Takumi; Lafonteese, David; Vashchenko, Vladislav; Vandersteen, Gerd; Hopper, P.; Groeseneken, Guido (2009-09)