Browsing by author "Hou, F. C."

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Bulk defect induced low-frequency noise in n+-p silicon diodes

Hou, F. C.; Bosman, Gijs; Simoen, Eddy; Vanhellemont, Jan; Claeys, C. (1998)
Noise characterization of gated silicon p-n diodes

Hou, F. C.; Bosman, Gijs; Simoen, Eddy; Claeys, Cor (1997)