Bulk defect induced low-frequency noise in n+-p silicon diodes

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Authors

Hou, F. C.; Bosman, Gijs; Simoen, Eddy; Vanhellemont, Jan; Claeys, C.

Issue

12

Journal

IEEE Trans. Electron Devices

Volume

45

Title

Bulk defect induced low-frequency noise in n+-p silicon diodes

Publication type

Journal article

Embargo date

9999-12-31

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