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Bulk defect induced low-frequency noise in n+-p silicon diodes
Publication:
Bulk defect induced low-frequency noise in n+-p silicon diodes
Date
1998
Journal article
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3097.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hou, F. C.
;
Bosman, Gijs
;
Simoen, Eddy
;
Vanhellemont, Jan
;
Claeys, C.
Journal
IEEE Trans. Electron Devices
Abstract
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2005
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations
Metrics
Views
2005
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations