Browsing by author "Hatchtel, Jordan"

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Activation energies for oxide- and interface-trap charge generation due to negative-bias--temperature stress of Si-capped SiGe-pMOSFETs

Xing, Guo; Hatchtel, Jordan; Linten, Dimitri; Mitard, Jerome; Witters, Liesbeth; Collaert, Nadine; Pantelides, Sokrates (2015-09)